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40.
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G. Kim, Y.-Q. Zhang, T. Min, H. Suh, J. H. Jang, H. Kong, J. Lee, J. Lee, T-Y. Jeon, I. Lee, J. Cho, H. Ohta, H. Jeen, Extremely Ligh Carrier-Effective Mass in a Distorted Simple Metal Oxide Advanced Electronic Materials 5, 1800504 (2019).
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39.
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S. J. Kwon, B. M. Jung, T. Kim, J. Byun, J. Lee, S. B. Lee, U H. Choi Influence of Al2O3 nanowires on ion transport in nanocomposite SPE. Macromolecules 51 (24), 10194 (2018). |
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38.
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S. Roy*, W. Choi*, S. Jeon*, D.-H. Kim, H. Kim, S.J. Yun, Y. Lee, J. Lee*, Y.-M. Kim*, J. Kim* Atomic Observation of Filling Vacancies in Monolayer Transition Metal Sulfides by Chemically Sourced Sulfur Atoms, Nano Letters 18, 4523-4530 (2018). |
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37.
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S. Kang, S. Jeon, S. Kim, D. Sel, H. Yang, J. Lee*, Y. Kim* Tunable Out-of-Plane Piezoelectricity in Thin-Layered MoTe2 by Surface Corrugation-Mediated Flexoelectricity ACS Applied Materials & Interfaces 10, 27424-27431 (2018).
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36.
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E. Ahn, T. Min, J. Lee, I. Lee, Y. Kim, H. Jeen Role of surface oxidation for thickness-driven insulator-to-metal transition in epitaxial MoO2 films. Applied Surface Science, 459, 92-97 (2018) |
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35.
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A. Khare, J. Lee, J. Park, G.-Y. Kim, S.-Y. Choi, T. Katase, S. Roh, T. S. Yoo, J. Hwang, H. Ohta, J. Son, W. S. Choi Directing oxygen vacancy channel in SrFeO2.5 epitaxial thin films. ACS Applied Materials & Interfaces, 10, 4831-4837 (2018) |
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34.
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H. J. Lee, E.-J. Guo, T. Min, S. H. Hwang, S. Y. Lee, K. Dörr, J. Lee, J. Y. Jo In situ observation of atomic movement in a ferroelectric film under an external electric field and stress. Nano Research, 11(7), 3824-3832 (2018) |
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33.
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J. H. Park, R. Murugesan, J. Lee, N. R. Aluru, Anomalous Characteristics of Pore Formation in Graphene Induced by Si-Nanoparticle Bombardment. MRS Communications, 7, 840-847 (2017). |
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32.
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S. Song, J. Kim, D. Lee, J. Lee, T. Min, J.-A. Chae, J-S Bae, J. Lee, J.-S. Lee, S. Park
The effect of Fe2+ state in electrical property variations of Sn-doped Hematite powders J. Am. Ceram. Soc. 100(9), 3928 (2017). |
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31.
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T. T. Ly, G. Duvjir, T. Min, J. Byun, T. Kim, M. M. Saad, N. T. M. Hai, S. Cho, J. Lee*, J. Kim* Atomistic study of the alloying behavior of crystalline SnSe1-xSx Phys. Chem. Chem. Phys. 19, 21648-21654 (2017). |
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